This combination of functions in one device makes it the ideal tool for developers on putting into operation of electronic devices.
With the bring-up of a prototype a developer goes step by step, on implementing parts of a circuit successively and testing their funtions one after another. For doing this he needs in addition to an oscilloscope also a function and waveforme generator to replace non existing input signals.
Netlists testing per JTAG
To examine the hardware, the boundary-scan method is increasingly used in which through the JTAG interface internal connection checks can be performed and so a large part of the netlilsts can be tested. In addition to this a code can be loaded in programmable components via the Boundary Scan interface.
What was previously only possible with a variety of devices, can be carried out with the XJTAG Expert ADF-2 and a laptop at any desk.
Boundary Scan Features
- Compatible with XJLink2
- up to 4 TAP connections to UUT
- USB power supply without power pack
- Up to 166MHz TCK frequencies
- Fast Flash Programming
- Integrated power measurement (0-5V) on each pin
- 2 channels
- 200 MHz bandwidth
- 128 MSample buffer memory
- 8 bits resolution
- External trigger
- Overload protection ± 100 V
- Frequency DC - 200 MHz
- Display modes: Magnitude, average, peak hold
- Windowing functions: Rectangular, Gaussian, triangular, flat-top, Blackman, Blackman-Harris, Hamming, Hann
- FFT points: from 128 - 1 million selectable
- Frequency-domain measurements: THD, THD+N, SNR, SINAD, etc.
- Signals: Sine, square, triangle, ramp, noise, etc.
- Frequency: DC to 1 MHz
- Accuracy: ± 50 ppm
- Resolution: less than 0.01 Hz
- Overvoltage protection ± 100 V
- 8 KSample buffer size
- 20 MHz update Rate
- Bandwidth 1 MHz
- 12 Bits Resolution
- Rise time (10%-90%): 100 ns
Serial Protocol Analyser
- CAN bus, I2C, SPI, RS232, UART
- Multiple format views
- Frame filtering and search options
- Hex data as text export